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X-ray diffractometer DSO-2V2 for the specification of crystals orientationAutomatic 3-circle X-ray diffractometer DSO-2V2 is intended for the orientation measurement of big crystals and wafers, including the searching of a primary flat direction. The mehod of measurement is based on the analysis of a diffraction pattern observed at the rotation of X-ray source around the Bragg axis, which lies in a plane of crystal surface.
Fig.1. General view of DSO-2V2. Specification
Optical scheme and construction The measurement of a crystal orientation is realized by the X-ray diffraction method. The optical diagram is presented in fig.2. Scintillation detector with aperture ±7.5° moves to a Theta position for the selected reflection, and the X-ray source monoblock XRB scans the angle range close to Theta. Diffractometer allows the using both symmetric and asymmetric reflections. The using of asymmetric reflections is needed in a case of primary flat search on crystals with a not cubic lattice. Ñylindrical ingot is mounted horizontally on the rollers with a manually rotating drive, if a definition of primary flat direction is needed. The general view of a three circle goniometer is represented in fig.3. Goniometer is mounted inside of a diffractometer sceleton under platform with a base table. The control block of diffractometer should be placed on a separate table in a couple with a personal computer. Diffractometer is controlled via the Ethernet channel.
Fig.2. X-ray optic diagram of DSO-2V2.
Fig.3. Three-circle goniometer. 1 - X-ray source monoblock, 2 – scintillation counter, 3 – collimator, 4 –shutter solenoid, 5 – arc slides, 6 – sine drive, 7- infrared presence sensor, 8 – cable channel, 9 - slit.
Fig.4. Sample mounting platform.
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